1. Combined EPMA, FIB and Monte Carlo simulation: a versatile tool for quantitative analysis of multilayered structures. Issue 1 (January 2016) Authors: Richter, S; Pinard, P T Journal: IOP conference series Issue: Volume 109:Issue 1(2016) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Development and validation of standardless and standards-based X-ray microanalysis. Issue 1 (July 2020) Authors: Pinard, P T; Protheroe, A; Holland, J; Burgess, S; Statham, P J Journal: IOP conference series Issue: Volume 891:Issue 1(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution. Issue 1 (January 2016) Authors: Fournelle, J; Cathey, H; Pinard, P T; Richter, S Journal: IOP conference series Issue: Volume 109:Issue 1(2016) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Quantification of low concentration elements using soft X-rays at high spatial resolution. Issue 1 (January 2016) Authors: Pinard, P T; Richter, S Journal: IOP conference series Issue: Volume 109:Issue 1(2016) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗