Low voltage EPMA: experiments on a new frontier in microanalysis - analytical lateral resolution. Issue 1 (January 2016)

• Record Type: Journal Article
• Authors: Fournelle, J; Cathey, H; Pinard, P T; Richter, S
• Is Part Of: IOP conference series. Volume 109:Issue 1(2016)
• Publication Date: 2016-01
• Subjects: Materials science -- Periodicals; 620.1105
• DOI: 10.1088/1757-899X/109/1/012003
• Languages: English
• ISSNs: 1757-8981

Abstract

Abstract: Field emission (FE) electron gun sources provide new capabilities for high lateral resolution EPMA. The determination of analytical lateral resolution is not as straightforward as that for electron microscopy imaging. Results from two sets of experiments to determine the actual lateral resolution for accurate EPMA are presented for Kα X-ray lines of Si and Al and La of Fe at 5 and 7 keV in a silicate glass. These results are compared to theoretical predictions and Monte Carlo simulations of analytical lateral resolution. The experiments suggest little is gained in lateral resolution by dropping from 7 to 5 keV in EPMA of this silicate glass.