1. A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics. (November 2021) Authors: Phoulady, Adrian; May, Nicholas; Choi, Hongbin; Shahbazmohamadi, Sina; Tavousi, Pouya Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation. (November 2022) Authors: May, Nicholas; Choi, Hongbin; Phoulady, Adrian; Suleiman, Yara; DiMase, Daniel; Tavousi, Pouya; Shahbazmohamadi, Sina Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples. (August 2021) Authors: Yuan, Yu; Clusiau, Sabrina; Gauvin, Raynald; Bleck, Christopher; Phoulady, Adrian; Tavousi, Pouya; Shahbazmohamadi, Sina; Piché, Nicolas; Marsh, Mike Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 776 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Model for predicting surface properties of lasered samples. (August 2021) Authors: Phoulady, Adrian; Choi, Hongbin; May, Nicholas; Ahmadi, Bahar; Tavousi, Pouya; Shahbazmohamadi, Sina Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 3186 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy. (November 2022) Authors: Choi, Hongbin; May, Nicholas; Phoulady, Adrian; Suleiman, Yara; DiMase, Daniel; Shahbazmohamadi, Sina; Tavousi, Pouya Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy. (August 2022) Authors: May, Nicholas; Phoulady, Adrian; Choi, Hongbin; Tavousi, Pouya; Shahbazmohamadi, Sina Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 876 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography. (August 2022) Authors: May, Nicholas; Choi, Hongbin; Phoulady, Adrian; Tavousi, Pouya; Shahbazmohamadi, Sina Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 284 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗