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2. Analysis of efficiency curves in near-UV, blue, and green-emitting InGaN-based multiple quantum wells using rate equations of exciton recombination. (12th April 2019)

3. Anisotropic radius of curvature of crystal planes in wide-bandgap semiconductor wafers measured by X-ray diffraction. (2nd December 2021)

4. Characterization of semipolar {11$ \bar 2 $2} light‐emitting diodes using a hole blocking layer. Issue 3 (17th February 2014)

5. Correlation between structural properties and nonradiative recombination behaviors of threading dislocations in freestanding GaN substrates grown by hydride vapor phase epitaxy. Issue 48 (10th November 2020)

6. Crystalline property analysis of semipolar (20–21) GaN on (22–43) patterned sapphire substrate by X‐ray microdiffraction and transmission electron microscopy. Issue 5 (4th February 2015)

7. Deep ultraviolet emission from multiple quantum wells on flat N-polar AlN templates fabricated using periodical pulsed H2 etching. (10th November 2021)

10. Effect of superlattice on light output power of InGaN‐based light‐emitting diodes fabricated on underlying GaN substrates with different dislocation densities. Issue 5 (29th March 2016)