Author/Creator: Ohata, Akiko - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Ohata, Akiko

1. Direct Characterization of Impact Ionization Current in Silicon-on-Insulator Body-Contacted MOSFETs. (27th March 2015)

Authors:: Marquez, Carlos; Rodriguez, Noel; Montes, Jose Manuel; Ruiz, Rafael; Gamiz, Francisco; Sampedro, Carlos; Ohata, Akiko
Journal:: ECS transactions
Issue:: Volume 66:Number 5(2015)
Page Start:: 93
Record Type:: Journal Article
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2. Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation. (March 2016)

Authors:: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ruiz, Rafael; Ohata, Akiko
Journal:: Solid-state electronics
Issue:: Volume 117(2016)
Page Start:: 60
Record Type:: Journal Article
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3. Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation. (March 2016)

Authors:: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ruiz, Rafael; Ohata, Akiko
Journal:: Solid-state electronics
Issue:: Volume 117(2016)
Page Start:: 60
Record Type:: Journal Article
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4. Memcapacitor emulator based on the Miller effect. (19th February 2019)

Authors:: Romero, Francisco J.; Morales, Diego P.; Godoy, Andres; Ruiz, Francisco G.; Tienda‐Luna, Isabel M.; Ohata, Akiko; Rodriguez, Noel
Journal:: International journal of circuit theory and applications
Issue:: Volume 47:Number 4(2019)
Page Start:: 572
Record Type:: Journal Article
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5. Systematic method for electrical characterization of random telegraph noise in MOSFETs. (February 2017)

Authors:: Marquez, Carlos; Rodriguez, Noel; Gamiz, Francisco; Ohata, Akiko
Journal:: Solid-state electronics
Issue:: Volume 128(2017)
Page Start:: 115
Record Type:: Journal Article
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