Author/Creator: Oeder, Thorsten - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Oeder, Thorsten

1. Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. (September 2017)

Authors:: Oeder, Thorsten; Castellazzi, Alberto; Pfost, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 321
Record Type:: Journal Article
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