11. Broadband Spectroscopic Characterization of Hybrid Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (19th August 2016) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Montgomery, Karl R.; Amoah, Papa K.; You, Lin; Kopanski, Joseph J.; Obrzut, Jan Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 199 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
12. Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Aging. (11th February 2020) Authors: Kombolias, Mary; Obrzut, Jan; Postek, Michael T.; Poster, Dianne L.; Obeng, Yaw S. Journal: Analytical letters Issue: Volume 53:Number 3(2020) Page Start: 424 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
13. Dielectric Spectroscopic Detection of Early Failures in 3-D Integrated Circuits. (10th September 2015) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Ahn, Jung-Joon; You, Lin; Kopanski, Joseph J. Journal: ECS transactions Issue: Volume 69:Number 6(2015) Page Start: 69 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
14. Low Frequency Radio Wave Detection of Electrically Active Defects in Dielectrics. (1st January 2016) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Amoah, Papa K.; Franklin, Rhonda R.; Kabos, Pavel Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3025 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
15. Low Frequency Radio Wave Detection of Electrically Active Defects in Dielectrics. (3rd November 2015) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Amoah, Papa K.; Franklin, Rhonda R.; Kabos, Pavel Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3025 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
16. Microwave Monitoring of Atmospheric Corrosion of Interconnects. (1st January 2018) Authors: Amoah, Papa K.; Veksler, Dmitry; Sunday, Christopher E.; Moreau, Stéphane; Bouchu, David; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 12(2018) Page Start: N143 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
17. Microwave Monitoring of Atmospheric Corrosion of Interconnects. (28th December 2018) Authors: Amoah, Papa K.; Veksler, Dmitry; Sunday, Christopher E.; Moreau, Stéphane; Bouchu, David; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 12(2018) Page Start: N143 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
18. The Impact of Organic Additives on Copper Trench Microstructure. Issue 9 (1st January 2017) Authors: Marro, James B.; Okoro, Chukwudi A.; Obeng, Yaw S.; Richardson, Kathleen C. Journal: Journal of the Electrochemical Society Issue: Volume 164:Issue 9(2017) Page Start: D543 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
19. The Impact of Organic Additives on Copper Trench Microstructure. Issue 9 (28th June 2017) Authors: Marro, James B.; Okoro, Chukwudi A.; Obeng, Yaw S.; Richardson, Kathleen C. Journal: Journal of the Electrochemical Society Issue: Volume 164:Issue 9(2017) Page Start: D543 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
20. Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials. (17th August 2016) Authors: Obeng, Yaw S.; Okoro, Chukwudi A.; Amoah, Papa K.; Dai, Johnny; Vartanian, Victor H. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 9(2016) Page Start: N61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗