1. (Invited) A Novel Optical Characterization of a-Si:H/c-Si Interface Microstructures Based on Data of Positron Annihilation Spectroscopy. (3rd July 2019) Authors: Matsuki, Nobuyuki; Matsui, Takuya; Michishio, Koji; O' Rourke, Brian; Oshima, Nagayasu; Uedono, Akira Journal: ECS transactions Issue: Volume 92:Number 9(2019) Page Start: 21 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗