Search
Search Constraints
You searched for: Author/Creator Notte, JohnLimit your search
- Notte, John [remove] 14
- 502.82 10
- Microchemistry -- Periodicals 10
- Microscopy -- Periodicals 10
- 502.8 2
- 620.11 2
- Helium ion microscopy, -- secondary electron (SE) imaging, -- neon ion SIMS, -- high spatial resolution analysis, -- NanoFab 2
- Materials science -- Periodicals 2
- Microscope and microscopy -- Periodicals 2
- branched nanowires -- focused ion beam -- focused ion beam‐induced deposition -- helium ion microscopy -- Ion beam‐induced bending -- kirigami -- neon focused ion beam 2