Author/Creator: Nishi, Yoshio - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Nishi, Yoshio

1. (Invited) Mechanism Study of Reversible Resistivity Change in Oxide Thin Film. (9th September 2015)

Authors:: Hong, Seungbum; Chang, Seo Hyoung; Phatak, Charudatta; Magyari-Kope, Blanka; Nishi, Yoshio; Chattopadhyay, Soma; Kim, Jung Ho
Journal:: ECS transactions
Issue:: Volume 69:Number 3(2015)
Page Start:: 51
Record Type:: Journal Article
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2. Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors. Issue 14 (2nd February 2016)

Authors:: Kumar, Suhas; Graves, Catherine E.; Strachan, John Paul; Grafals, Emmanuelle Merced; Kilcoyne, Arthur L. David; Tyliszczak, Tolek; Weker, Johanna Nelson; Nishi, Yoshio; Williams, R. Stanley
Journal:: Advanced materials
Issue:: Volume 28:Issue 14(2016)
Page Start:: 2772
Record Type:: Journal Article
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3. Electronic structure and stability of low symmetry Ta2O5polymorphs. Issue 6 (20th May 2014)

Authors:: Kim, Ja‐Yong; Magyari‐Köpe, Blanka; Lee, Kee‐Jeung; Kim, Hyeong‐Soo; Lee, Seok‐Hee; Nishi, Yoshio
Journal:: Physica status solidi
Issue:: Volume 8:Issue 6(2014:Jun.)
Page Start:: 560
Record Type:: Journal Article
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4. Epitaxially Grown Strained Pentacene Thin Film on Graphene Membrane. Issue 17 (7th January 2015)

Authors:: Kim, Kwanpyo; Santos, Elton J. G.; Lee, Tae Hoon; Nishi, Yoshio; Bao, Zhenan
Journal:: Small
Issue:: Volume 11:Issue 17(2015)
Page Start:: 2037
Record Type:: Journal Article
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5. Formation of epitaxial Hf digermanide/Ge(001) contact and its crystalline properties. (22nd June 2018)

Authors:: Nakatsuka, Osamu; Suzuki, Akihiro; McVittie, James; Nishi, Yoshio; Zaima, Shigeaki
Journal:: Japanese journal of applied physics
Issue:: Volume 57:Number 7(2018)Supplement 2
Page Start:
Record Type:: Journal Article
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6. Local Temperature Redistribution and Structural Transition During Joule‐Heating‐Driven Conductance Switching in VO2. (19th July 2013)

Authors:: Kumar, Suhas; Pickett, Matthew D.; Strachan, John Paul; Gibson, Gary; Nishi, Yoshio; Williams, R. Stanley
Journal:: Advanced materials
Issue:: Volume 25:Number 42(2013)
Page Start:: 6128
Record Type:: Journal Article
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7. Measuring the volume charge in dielectric films using single frequency electro-acoustic waves. Issue 4 (3rd March 2014)

Authors:: Pei, Dongfei; Shkel, Yuri M.; Klingenberg, Daniel J.; Segal, Zakai I.; Nishi, Yoshio; Shohet, J. Leon
Journal:: Journal of materials research
Issue:: Volume 29:Issue 4(2014)
Page Start:: 501
Record Type:: Journal Article
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8. Measuring the volume charge in dielectric films using single frequency electro-acoustic waves. Issue 4 (3rd March 2014)

Authors:: Pei, Dongfei; Shkel, Yuri M.; Klingenberg, Daniel J.; Segal, Zakai I.; Nishi, Yoshio; Shohet, J. Leon
Journal:: Journal of materials research
Issue:: Volume 29:Issue 4(2014)
Page Start:: 501
Record Type:: Journal Article
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9. Memristors: Direct Observation of Localized Radial Oxygen Migration in Functioning Tantalum Oxide Memristors (Adv. Mater. 14/2016). Issue 14 (April 2016)

Authors:: Kumar, Suhas; Graves, Catherine E.; Strachan, John Paul; Grafals, Emmanuelle Merced; Kilcoyne, Arthur L. David; Tyliszczak, Tolek; Weker, Johanna Nelson; Nishi, Yoshio; Williams, R. Stanley
Journal:: Advanced materials
Issue:: Volume 28:Issue 14(2016)
Page Start:: 2771
Record Type:: Journal Article
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10. Sequential Electronic and Structural Transitions in VO2 Observed Using X‐ray Absorption Spectromicroscopy. (15th October 2014)

Authors:: Kumar, Suhas; Strachan, John Paul; Pickett, Matthew D.; Bratkovsky, Alexander; Nishi, Yoshio; Williams, R. Stanley
Journal:: Advanced materials
Issue:: Volume 26:Number 44(2014)
Page Start:: 7505
Record Type:: Journal Article
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