1. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope. (August 2019) Authors: Naresh-Kumar, G.; Trager-Cowan, C.; Mingard, K. P. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 504 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors. (23rd September 2015) Authors: Vilalta-Clemente, Arantxa; Naresh-Kumar, G.; Nouf-Allehiani, M.; Parbrook, Peter J.; Boulbar, Emmanuel D.Le; Allsopp, Duncan; Shields, Philip A.; Trager-Cowan, Carol; Wilkinson, Angus J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2217 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors. (August 2015) Authors: Vilalta-Clemente, Arantxa; Naresh-Kumar, G.; Nouf-Allehiani, M.; Parbrook, Peter J.; Boulbar, Emmanuel D.Le; Allsopp, Duncan; Shields, Philip A.; Trager-Cowan, Carol; Wilkinson, Angus J. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 2217 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges. (August 2019) Authors: Naresh-Kumar, G.; Alasamari, A.; Hourahine, Ben; Trager-Cowan, C. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1760 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction. (August 2019) Authors: Naresh-Kumar, G.; Trager-Cowan, C.; Winkelmann, A. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 2404 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗