1. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗