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You searched for: Author/Creator Nagai, Yasuyoshi

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1. 3D impurity profiles of doped/intrinsic amorphous-silicon layers composing textured silicon heterojunction solar cells detected by atom probe tomography. (3rd December 2020)

3. Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach. (4th February 2019)

7. Crystallite distribution analysis based on hydrogen content in thin-film nanocrystalline silicon solar cells by atom probe tomography. (16th December 2020)

8. Defect characterization, mechanical and thermal property evaluation in CVD-W after low-dose neutron irradiation. (December 2019)

9. Elemental Distribution in Multilayer Systems by Laser-Assisted Atom Probe Tomography with Various Analysis Directions. (December 2015)

10. Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional–integral–differential controller. (4th March 2019)