1. Degradation of deep ultraviolet photoresist by As‐implantation studied by Ar‐cluster beam profiling. (1st August 2012) Authors: Conard, T.; Franquet, A.; Tsvetanova, D.; Mouhib, T.; Vandervorst, W. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 406 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters. (5th June 2012) Authors: Mouhib, T.; Poleunis, C.; Möllers, R.; Niehuis, E.; Defrance, P.; Bertrand, P.; Delcorte, A. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 163 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Organic ion yield enhancement in secondary ion mass spectrometry using water vapour injection. (15th May 2012) Authors: Mouhib, T.; Delcorte, A.; Poleunis, C.; Bertrand, P. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 46 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study. (17th July 2012) Authors: Wehbe, N.; Tabarrant, T.; Brison, J.; Mouhib, T.; Delcorte, A.; Bertrand, P.; Moellers, R.; Niehuis, E.; Houssiau, L. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 178 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗