1. Detailed surface analysis of V‐defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition. Corrigendum. Issue 1 (27th January 2020) Authors: Gao, Jiang-Dong; Zhang, Jian-Li; Zhu, Xin; Wu, Xiao-Ming; Mo, Chun-Lan; Pan, Shuan; Liu, Jun-Lin; Jiang, Feng-Yi Journal: Journal of applied crystallography Issue: Volume 53:Issue 1(2020) Page Start: 302 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Detailed surface analysis of V‐defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition. Issue 3 (31st May 2019) Authors: Gao, Jiang-Dong; Zhang, Jian-Li; Zhu, Xin; Wu, Xiao-Ming; Mo, Chun-Lan; Pan, Shuan; Liu, Jun-Lin; Jiang, Feng-Yi Journal: Journal of applied crystallography Issue: Volume 52:Issue 3(2019) Page Start: 637 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗