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3. Experimental study on interface region of two-dimensional Si layers by forming gas annealing. (4th March 2016)

4. Group-IV-semiconductor quantum-dots in thermal SiO2 layer fabricated by hot-ion implantation technique: different wavelength photon emissions. (12th February 2021)

6. Minority Carrier Annihilation at Crystalline Silicon Interface in Metal Oxide Semiconductor Structure. Issue 1666 (3rd November 2014)

7. Nano-SiC region formation in (100) Si-on-insulator substrate: Optimization of hot-C+-ion implantation process to improve photoluminescence intensity. (8th March 2018)