1. Observations of inhomogeneity of 3C-SiC layers grown on 6H-SiC substrates by using scanning internal photoemission microscopy. (23rd February 2018) Authors: Shiojima, Kenji; Mishina, Naoki; Ichikawa, Naoto; Kato, Masashi Journal: Japanese journal of applied physics Issue: Volume 57:Number 4(2018)Supplement Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗