Author/Creator: Mattiazzo, S. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Mattiazzo, S.

1. A 110 nm CMOS process for fully-depleted pixel sensors. (17th June 2019)

Authors:: Pancheri, L.; Olave, J.; Panati, S.; Rivetti, A.; Cossio, F.; Rolo, M.; Demaria, N.; Giubilato, P.; Pantano, D.; Mattiazzo, S.
Journal:: Journal of instrumentation
Issue:: Volume 14:Number 6(2019)
Page Start:: C06016
Record Type:: Journal Article
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2. Advanced proton imaging in computed tomography. Issue 1 (24th April 2015)

Authors:: Mattiazzo, S.; Bisello, D.; Giubilato, P.; Pantano, D.; Pozzobon, N.; Snoeys, W.; Wyss, J.
Journal:: Radiation protection dosimetry
Issue:: Volume 166:Issue 1/4(2015)
Page Start:: 388
Record Type:: Journal Article
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3. Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT. Issue 9 (August 2015)

Authors:: Abbate, C.; Busatto, G.; Iannuzzo, F.; Mattiazzo, S.; Sanseverino, A.; Silvestrin, L.; Tedesco, D.; Velardi, F.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1496
Record Type:: Journal Article
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4. First characterization results of ARCADIA FD-MAPS after X-ray irradiation. (1st January 2023)

Authors:: Neubüser, C.; Corradino, T.; Dalla Betta, G.-F.; Mattiazzo, S.; Pancheri, L.
Journal:: Journal of instrumentation
Issue:: Volume 18:Number 1(2023)
Page Start:
Record Type:: Journal Article
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5. Impact of X-ray induced radiation damage on FD-MAPS of the ARCADIA project. (1st January 2022)

Authors:: Neubüser, C.; Corradino, T.; Mattiazzo, S.; Pancheri, L.
Journal:: Journal of instrumentation
Issue:: Volume 17:Number 1(2022)
Page Start:
Record Type:: Journal Article
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6. Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation. (September 2018)

Authors:: Abbate, C.; Busatto, G.; Mattiazzo, S.; Sanseverino, A.; Silvestrin, L.; Tedesco, D.; Velardi, F.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 941
Record Type:: Journal Article
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7. Radiation effects in a SPACIROC2 ASIC and long-term reliability. (19th July 2021)

Authors:: Placinta, V.M.; Cojocariu, L.N.; de La Taille, C.; Blin-Bondil, S.; Mattiazzo, S.; Silvestrin, L.; Candelori, A.; Maciuc, F.
Journal:: Journal of instrumentation
Issue:: Volume 16:Number 7(2021)
Page Start:
Record Type:: Journal Article
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