1. Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs. (January 2015) Authors: Bühler, R.T.; Agopian, P.G.D.; Collaert, N.; Simoen, E.; Claeys, C.; Martino, J.A. Journal: Solid-state electronics Issue: Volume 103(2015) Page Start: 209 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Enhanced dynamic threshold voltage UTBB SOI nMOSFETs. (October 2015) Authors: Sasaki, K.R.A.; Manini, M.B.; Simoen, E.; Claeys, C.; Martino, J.A. Journal: Solid-state electronics Issue: Volume 112(2015) Page Start: 19 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Experimental analysis and improvement of the DC method for self-heating estimation. (September 2019) Authors: Mori, C.A.B.; Agopian, P.G.D.; Martino, J.A. Journal: Solid-state electronics Issue: Volume 159(2019) Page Start: 171 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Gate dielectric material influence on DC behavior of MO(I)SHEMT devices operating up to 150 °C. (November 2021) Authors: Agopian, P.G.D.; Carmo, G.J.; Martino, J.A.; Simoen, E.; Peralagu, U.; Parvais, B.; Waldron, N.; Collaert, N. Journal: Solid-state electronics Issue: Volume 185(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Optimization of a nanoribbon charge-based biosensor using gateless BESOI pMOSFET structure. (November 2021) Authors: Sasaki, K.R.A.; Rangel, R.C.; Yojo, L.S.; Martino, J.A. Journal: Solid-state electronics Issue: Volume 185(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗