1. Total ionizing dose effects in multiple-gate field-effect transistor. (3rd July 2017) Authors: Gaillardin, Marc; Marcandella, Claude; Martinez, Martial; Raine, Mélanie; Paillet, Philippe; Duhamel, Olivier; Richard, Nicolas Journal: Semiconductor science and technology Issue: Volume 32:Number 8(2017:Aug.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗