Author/Creator: Marcello, G. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Marcello, G.

1. Clamp voltage and ideality factor in laser diodes. Issue 9 (August 2015)

Authors:: Vanzi, M.; Mura, G.; Marcello, G.; Martines, G.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 9/10(2015)
Page Start:: 1736
Record Type:: Journal Article
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2. Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study. (September 2018)

Authors:: Marcello, G.; Meda, E.; Medda, M.
Journal:: Microelectronics and reliability
Issue:: Volume 88/90(2018)
Page Start:: 294
Record Type:: Journal Article
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3. ESD tests on 850 nm GaAs-based VCSELs. (September 2016)

Authors:: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 617
Record Type:: Journal Article
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4. ESD tests on 850 nm GaAs-based VCSELs. (September 2016)

Authors:: Vanzi, M.; Mura, G.; Marcello, G.; Xiao, K.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 617
Record Type:: Journal Article
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5. LVI-based failure analysis after PRBS defect activation: Two cases study. (September 2019)

Authors:: Marcello, G.; Merassi, A.; Medda, M.
Journal:: Microelectronics and reliability
Issue:: Volume 100/101(2019)
Page Start:
Record Type:: Journal Article
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6. Practical optical gain by an extended Hakki-Paoli method. (September 2017)

Authors:: Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 579
Record Type:: Journal Article
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