1. Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures. (August 2014) Authors: Katz, M.B.; Twigg, M.E.; Maximenko, S.I.; Bassim, N.D.; Mahadik, N.A.; Jernigan, G.G.; Canedy, C.L.; Abell, J.; Affouda, C.A. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1064 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures. (August 2014) Authors: Katz, M.B.; Twigg, M.E.; Maximenko, S.I.; Bassim, N.D.; Mahadik, N.A.; Jernigan, G.G.; Canedy, C.L.; Abell, J.; Affouda, C.A. Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1064 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗