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2. Analysis of composition and microstructures of Ge grown on porous silicon using Raman spectroscopy and transmission electron microscopy. (December 2017)

6. Electrical behavior of n‐GaAs based Schottky diode for different contacts: Temperature dependence of current‐voltage. (31st May 2021)

9. Experimental insights toward carrier localization in in-rich InGaAs/InP as candidate for SWIR detection: Microstructural analysis combined with optical investigation. (January 2023)