1. An improved preparation method for cross‐sectional TEM specimens of films deposited on metallic substrates. Issue 4 (25th January 2016) Authors: Ma, Bingyang; Shi, Kaicheng; Shang, Hailong; Zhang, Anming; Li, Rongbin; Li, Geyang Journal: Microscopy research and technique Issue: Volume 79:Issue 4(2016:Apr.) Page Start: 276 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗