1. An Interdisciplinary Study on the Environmental Reflection of Prehistoric Mining Activities at the Mitterberg Main Lode (Salzburg, Austria). (3rd March 2013) Authors: Breitenlechner, E.; Stöllner, TH.; Thomas, P.; Lutz, J.; Oeggl, K. Journal: Archaeometry Issue: Volume 56:Number 1(2014) Page Start: 102 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Arming T cells with C-X-C-motive receptor 6 enables adoptive T cell therapy of pancreatic cancer. (March 2019) Authors: Lesch, S.; Blumenberg, V.; Stoiber, S.; Ogonek, J.; Cadilha, B.; Dantes, Z.; Rataj, F.; Dorman, K.; Lutz, J.; Karches, C.; Heise, C.; Grassmann, S.; Megens, R.; Ruehland, S.; Di Pilato, M.; Pruessmann, J.; Ormanns, S.; Reischer, A.; Duewell, P.; Schnurr, M. Journal: European journal of cancer Issue: Volume 110(2019)Supplement 1 Page Start: S25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Arming T cells with C-X-C-motive receptor 6 enhances infiltration of pancreatic cancer patient-derived organoids. (March 2019) Authors: Ogonek, J.; Lutz, J.; Dantes, Z.; Lesch, S.; Stoiber, S.; Schuebel, M.; Voelkl, L.; Ormanns, S.; Reichert, M.; Endres, S.; Kobold, S. Journal: European journal of cancer Issue: Volume 110(2019)Supplement 1 Page Start: S24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Common and differential alterations of general emotion processing in obsessive-compulsive and social anxiety disorder. Issue 7 (25th January 2016) Authors: Weidt, S.; Lutz, J.; Rufer, M.; Delsignore, A.; Jakob, N. J.; Herwig, U.; Bruehl, A. B. Journal: Psychological medicine Issue: Volume 46:Issue 7(2016) Page Start: 1427 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Influence of different test strategies on the power cycling test results of 6.5 kV SiC MOSFETs. (November 2021) Authors: Gerlach, M.; Boldyrjew-Mast, R.; Bruchhold, F.; Lutz, J.; Basler, T.; Schwarzmann, H. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Internal processes in power semiconductors at virtual junction temperature measurement. (September 2016) Authors: Chen, W.; Franke, J.; Herold, C.; Bhojani, R.; Lutz, J. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 464 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Internal processes in power semiconductors at virtual junction temperature measurement. (September 2016) Authors: Chen, W.; Franke, J.; Herold, C.; Bhojani, R.; Lutz, J. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 464 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Investigation of repetitive short-circuit operation of 1200 V IGBTs in the IC-VCE phase space. (September 2019) Authors: Bhojani, R.; Baburske, R.; Mysore, M.L.; Kowalsky, J.; Lutz, J.; Niedernostheide, F.J.; Schulze, H.J. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress. (September 2019) Authors: Palanisamy, S.; Ahmmed, Md.K.; Kowalsky, J.; Lutz, J.; Basler, T. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Investigation of the current collapse behaviour in GaN power HEMTs with highly adjustable pulse and measurement concept. (November 2020) Authors: Goller, M.; Thim, M.A.; Song, J.; Kowalsky, J.; Franke, J.; Lutz, J. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗