1. Comparison between experimental and simulated strain profiles in Ge channels with embedded source/drain stressors. Issue 11 (25th July 2014) Authors: Bühler, R.; Eneman, G.; Favia, P.; Bender, H.; Vincent, B.; Hikavyy, A.; Loo, R.; Martino, J. A.; Claeys, C.; Simoen, E.; Collaert, N.; Thean, A.; Pizzini, Sergio; Kissinger, Gudrun Journal: Physica status solidi Issue: Volume 11:Issue 11/12(2014) Page Start: 1578 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗