1. (Invited) High Performance Amorphous In-W-Zn-O Thin Film Transistor with Ultra-Thin Active Channel for Low Voltage Operation. (23rd July 2018) Authors: Liu, Po-Tsun; Kuo, Po-Yi; Hsu, Shan-Ming Journal: ECS transactions Issue: Volume 86:Number 11(2018) Page Start: 91 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Reliability Enhancement of High-Mobility Amorphous Indium-Tungsten Oxide Thin Film Transistor. (4th May 2015) Authors: Liu, Po-Tsun; Chang, Chih-Hsiang; Chang, Chih-Jui Journal: ECS transactions Issue: Volume 67:Number 1(2015) Page Start: 9 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. 15‐3: Hydrogenated Amorphous Silicon Gate Driver on Array with Time‐Division Driving Method for In‐Cell Touch Liquid‐Crystal Display. Issue 1 (28th June 2021) Authors: Liu, Po-Tsun; Zheng, Guang-Ting; Lin, Ling-Chi Journal: Digest of technical papers Issue: Volume 52:Issue 1(2021) Page Start: 184 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. 19‐1: Invited Paper: Stability of Sputtered Amorphous Tungsten‐doped Indium Oxide Based Thin‐Film Transistors. Issue 1 (30th May 2018) Authors: Zhang, Qun; Yang, Zhao; Qu, Mingyue; Fu, Ruofan; Liu, Po-Tsun; Shieh, Han-Ping D. Journal: Digest of technical papers Issue: Volume 49:Issue 1(2018) Page Start: 225 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. 28‐4: Design of High Reliability a‐Si:H TFT Gate Driver with Threshold Voltage Compensation on TFT‐LCD Application. Issue 1 (30th May 2018) Authors: Liu, Po-Tsun; Zheng, Guang-Ting Journal: Digest of technical papers Issue: Volume 49:Issue 1(2018) Page Start: 365 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Annealing effects on resistive switching of IGZO-based CBRAM devices. (October 2020) Authors: Gan, Kai-Jhih; Liu, Po-Tsun; Ruan, Dun-Bao; Chiu, Yu-Chuan; Sze, Simon M. Journal: Vacuum Issue: Volume 180(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Back-Channel Etched Double Layer In-W-O/In-W-Zn-O Thin-Film Transistors. (23rd July 2018) Authors: Li, Zhen-Hao; Kuo, Po-Yi; Chen, Wen-Tzu; Liu, Po-Tsun Journal: ECS transactions Issue: Volume 86:Number 11(2018) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Bipolar resistive switching characteristics of tungsten-doped indium–zinc oxide conductive-bridging random access memory. (August 2019) Authors: Gan, Kai-Jhih; Liu, Po-Tsun; Lin, Sheng-Jie; Ruan, Dun-Bao; Chien, Ta-Chun; Chiu, Yu-Chuan; Sze, Simon M. Journal: Vacuum Issue: Volume 166(2019) Page Start: 226 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Characterization of Ferroelectric Characteristics for Hafnium Zirconium Oxide Capacitors with Refractory Electrodes. (1st May 2022) Authors: Liang, Yan-Kui; Lin, Jing-Wei; Huang, Yi-Shuo; Lin, Wei-Cheng; Young, Bo-Feng; Shih, Yu-Chuan; Lu, Chun-Chieh; Yeong, Sai Hooi; Lin, Yu-Ming; Liu, Po-Tsun; Chang, Edward Yi; Lin, Chun-Hsiung Journal: ECS journal of solid state science and technology Issue: Volume 11:Number 5(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Design of Bi-Directional Transmission Gate Driver in Amorphous Silicon Technology for TFT-LCD Application. (18th August 2016) Authors: Zheng, Guang-Ting; Liu, Po-Tsun; Wu, Meng-Chyi; Lu, i-Hsiang Journal: ECS transactions Issue: Volume 75:Number 10(2016) Page Start: 55 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗