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- Lim, Chan [remove] 7
- 541.3705 2
- 621.38152 2
- Electrochemistry -- Periodicals 2
- Semiconductors -- Periodicals 2
- degradation -- durability -- fuel cell -- membrane -- morphology -- transmission electron microscopy 2
- 332.09505 1
- 3D NAND -- charge trap memory -- charge loss -- retention -- SONOS -- charge spreading 1
- 505 1
- 541.3 1
- Asia -- Economic conditions -- Periodicals 1