1. P‐23: Effect of Buffer Layers on Performance and Reliability of Polycrystalline Silicon TFTs Fabricated on Polyimide. Issue 1 (2nd June 2017) Authors: Liu, Chan-Jui; Chen, Chien-Tao; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin; Chen, Bo-Wei; Chang, Ting-Chang Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1311 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. P‐23: Effect of Buffer Layers on Performance and Reliability of Polycrystalline Silicon TFTs Fabricated on Polyimide. Issue 1 (May 2017) Authors: Liu, Chan-Jui; Chen, Chien-Tao; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin; Chen, Bo-Wei; Chang, Ting-Chang Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1311 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. P‐24: A Novel Method to Improve the LTPS Devices on Flexible Substrate by Off‐state Bias Stress. Issue 1 (2nd June 2017) Authors: Hsu, Ting-Yu; Li, Hung-Wei; Huang, Ya-Qin; Chen, Chia-Kai; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1315 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. P‐24: A Novel Method to Improve the LTPS Devices on Flexible Substrate by Off‐state Bias Stress. Issue 1 (May 2017) Authors: Hsu, Ting-Yu; Li, Hung-Wei; Huang, Ya-Qin; Chen, Chia-Kai; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1315 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. P‐6: The Effects of Buffer Layers on the Electrical Characteristics and Stability of Self‐Aligned Top‐Gate IGZO Thin Film Transistors. Issue 1 (2nd June 2017) Authors: Ho, Yi-Da; Yang, Yu-Xin; Yang, Ching-Fei; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1246 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. P‐6: The Effects of Buffer Layers on the Electrical Characteristics and Stability of Self‐Aligned Top‐Gate IGZO Thin Film Transistors. Issue 1 (May 2017) Authors: Ho, Yi-Da; Yang, Yu-Xin; Yang, Ching-Fei; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; Lin, Yu-Hsin Journal: Digest of technical papers Issue: Volume 48:Issue 1(2017) Page Start: 1246 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗