P‐6: The Effects of Buffer Layers on the Electrical Characteristics and Stability of Self‐Aligned Top‐Gate IGZO Thin Film Transistors. Issue 1 (May 2017)
- Record Type:
- Journal Article
- Title:
- P‐6: The Effects of Buffer Layers on the Electrical Characteristics and Stability of Self‐Aligned Top‐Gate IGZO Thin Film Transistors. Issue 1 (May 2017)
- Main Title:
- P‐6: The Effects of Buffer Layers on the Electrical Characteristics and Stability of Self‐Aligned Top‐Gate IGZO Thin Film Transistors
- Authors:
- Ho, Yi-Da
Yang, Yu-Xin
Yang, Ching-Fei
Li, Hung-Wei
Tsai, Chih-Hung
Lu, Hsueh-Hsing
Lin, Yu-Hsin - Abstract:
- Abstract : The composition of buffer layer would be played a key role to affect the electrical performance and the reliability of the self‐aligned top‐gate a‐IGZO TFTs. In this work, the threshold voltage shift (ΔVth) of the device could be less than ±1V under positive and negative bias thermal illumination stress.
- Is Part Of:
- Digest of technical papers. Volume 48:Issue 1(2017)
- Journal:
- Digest of technical papers
- Issue:
- Volume 48:Issue 1(2017)
- Issue Display:
- Volume 48, Issue 1 (2017)
- Year:
- 2017
- Volume:
- 48
- Issue:
- 1
- Issue Sort Value:
- 2017-0048-0001-0000
- Page Start:
- 1246
- Page End:
- 1249
- Publication Date:
- 2017-05
- Subjects:
- a-IGZO TFTs -- buffer layer -- NBTIS
Information display systems -- Congresses
621.3815422 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/1799368.html ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2168-0159 ↗
http://ojps.aip.org/dbt/dbt.jsp?KEY=SIDSYM ↗
http://sid.aip.org/digest ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/sdtp.11878 ↗
- Languages:
- English
- ISSNs:
- 0097-966X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8271.680000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 1788.xml