1. Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. (September 2018) Authors: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Touboul, A.D.; Pouget, V. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 920 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. RF-driving of acoustic-optical tunable filters; design, realization and qualification of analog and digital modules for ESA. Issue 9 (August 2015) Authors: Vanhamel, J.; Fussen, D.; Dekemper, E.; Neefs, E.; Van Opstal, B.; Pieroux, D.; Maes, J.; Van Lil, E.; Leroux, P. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2103 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. The VFAT3-Comm-Port: a complete communication port for front-end ASICs intended for use within the high luminosity radiation environments of the LHC. (16th March 2015) Authors: Dabrowski, M.; Aspell, P.; Bonacini, S.; Ciaglia, D.; Lentdecker, G. De; Robertis, G. De; Kloukinas, K.; Kupiainen, M.; Leroux, P.; Tavernier, F.; Talvitie, J.; Tuuva, T. Journal: Journal of instrumentation Issue: Volume 10:Number 3(2015:Mar.) Page Start: C03019 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A single shot TDC with 4.8 ps resolution in 40 nm CMOS for high energy physics applications. (22nd January 2015) Authors: Prinzie, J.; Steyaert, M.; Leroux, P. Journal: Journal of instrumentation Issue: Volume 10:Number 1(2015:Jan.) Page Start: C01031 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. FPGA based flexible UWB pulse transmitter using EM subtraction. Issue 19 (1st September 2013) Authors: Strackx, M.; Faes, B.; D'Agostino, E.; Leroux, P.; Reynaert, P. Journal: Electronics letters Issue: Volume 49:Issue 19(2013) Page Start: 1243 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. A radiation tolerant clock generator for the CMS endcap timing layer readout chip. (1st March 2022) Authors: Sun, H.; Sun, Q.; Biereigel, S.; Francisco, R.; Gong, D.; Huang, G.; Huang, X.; Kulis, S.; Leroux, P.; Liu, C.; Liu, T.; Liu, T.; Moreira, P.; Prinzie, J.; Wu, J.; Ye, J.; Zhang, L.; Zhang, W. Journal: Journal of instrumentation Issue: Volume 17:Number 3(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells. (September 2019) Authors: Aguiar, Y.Q.; Wrobel, F.; Guagliardo, S.; Autran, J.-L.; Leroux, P.; Saigné, F.; Touboul, A.D.; Pouget, V. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Methods for clock signal characterization using FPGA resources. (17th March 2020) Authors: Biereigel, S.; Kulis, S.; Moreira, P.; Prinzie, J.; Leroux, P.; Koelpin, A. Journal: Journal of instrumentation Issue: Volume 15:Number 3(2020) Page Start: P03012 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Reliability-driven pin assignment optimization to improve in-orbit soft-error rate. (November 2020) Authors: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Pouget, V.; Touboul, A.D. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications. (November 2020) Authors: Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Leroux, P.; Saigné, F.; Pouget, V.; Touboul, A.D. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗