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2. Characteristics of ALD‐ZnO Thin Film Transistor Using H2O and H2O2 as Oxygen Sources (Adv. Mater. Interfaces 15/2022). Issue 15 (23rd May 2022)

4. Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X‐ray diffraction. (9th August 2017)

5. ChemInform Abstract: Understanding Ionic Liquids from Theoretical Methods. Issue 51 (23rd December 2014)