1. A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films. (August 2020) Authors: Penn, Aubrey; Koohfar, Sanaz; Kumah, Divine; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1192 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A Universal Scripting Engine for Transmission Electron Microscopy. (August 2020) Authors: LeBeau, James; Kumar, Abinash; Hauwiller, Matthew Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2958 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Automating Electron Microscopy through Machine Learning and USETEM. (August 2021) Authors: Xu, Michael; Kumar, Abinash; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2988 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Combined iDPC and EELS analyses for quantifying oxygen vacancy concentration in LSMO. (August 2021) Authors: Penn, Aubrey; Koohfar, Sanaz; Kumah, Divine; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1196 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior. (August 2020) Authors: Kumar, Abinash; Baker, Jonathon; Cabral, Matthew; Bowes, Preston; Zhang, Shujun; Dickey, Elizabeth; Irving, Douglas; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 490 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Forbidden Reflection Moiré Patterns in Metal-2D Material Interfaces. (August 2020) Authors: Reidy, Kate; Varnavides, Georgios; Thomsen, Joachim Dahl; Blackburn, Arthur; Pham, Thang; Kumar, Abinash; LeBeau, James; Ross, Frances Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 860 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Mapping Dopant Defect Complexes at the Nano and Atomic Scale for Quantum Computing. (August 2020) Authors: Hauwiller, Matthew; Kumar, Abinash; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2562 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Probing point and planar defects in multiferroic YFeO3 thin films. (August 2021) Authors: Kumar, Abinash; Ning, Shuai; Klyukin, Konstantin; Yildiz, Bilge; Ross, Caroline; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2144 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Promoting Mechanistic Understanding of Lithium Deposition and Solid‐Electrolyte Interphase (SEI) Formation Using Advanced Characterization and Simulation Methods: Recent Progress, Limitations, and Future Perspectives. Issue 19 (25th March 2022) Authors: Xu, Yaolin; Dong, Kang; Jie, Yulin; Adelhelm, Philipp; Chen, Yawei; Xu, Liang; Yu, Peiping; Kim, Junghwa; Kochovski, Zdravko; Yu, Zhilong; Li, Wanxia; LeBeau, James; Shao‐Horn, Yang; Cao, Ruiguo; Jiao, Shuhong; Cheng, Tao; Manke, Ingo; Lu, Yan Journal: Advanced energy materials Issue: Volume 12:Issue 19(2022) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Quantitative Analysis of Correlated Atomic Displacements via Diffuse Electron Scattering. (August 2020) Authors: Chen, Xi; Varnavides, Georgios; Anikeeva, Polina; LeBeau, James Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 718 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗