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1. Analysis of strain relaxation process in GaInN/GaN heterostructure by in situ X‐ray diffraction monitoring during metalorganic vapor‐phase epitaxial growth. Issue 3 (30th January 2013)

2. Relationship between misfit-dislocation formation and initial threading-dislocation density in GaInN/GaN heterostructures. (1st October 2015)