1. Analysis of Li Ion Battery Anodes Using In-situ FIB-ToF-SIMS. (August 2020) Authors: Smentkowski, Vincent; Hart, Richard; Cao, Hongbo; Kollmer, Felix; Zakel, Julia; Arlinghaus, Henrik Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2686 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling. (August 2021) Authors: Smentkowski, Vincent; Goswami, Shubhodeep; Kollmer, Felix; Zakel, Julia; Arlinghaus, Henrik; Rading, Derk Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1564 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Identification of nanoparticles and their localization in algal biofilm by 3D-imaging secondary ion mass spectrometry. Issue 6 (28th March 2019) Authors: Benettoni, Pietro; Stryhanyuk, Hryhoriy; Wagner, Stephan; Kollmer, Felix; Moreno Osorio, Jairo H.; Schmidt, Matthias; Reemtsma, Thorsten; Richnow, Hans-Hermann Journal: Journal of analytical atomic spectrometry Issue: Volume 34:Issue 6(2019) Page Start: 1098 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. (August 2014) Authors: Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 2086 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures. (August 2014) Authors: Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 2086 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces. (August 2020) Authors: Kollmer, Felix; Pirkl, Alexander; Kayser, Sven; Arlinghaus, Henrik; Moellers, Rudolf; Havercroft, Nathan; Niehuis, Ewald Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 76 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Recent Innovations and Perspectives in TOF-SIMS. (August 2022) Authors: Kollmer, Felix; Pirkl, Alexander; Arlinghaus, Henrik; Möllers, Rudolf; Havercroft, Nathan; Niehuis, Ewald Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 942 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions. (23rd September 2015) Authors: Dianoux, Raphaelle; Scheidemann, Adi; Niehuis, Ewald; Mollers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Hug, Hans-Josef; Bernard, Laetitia; Vranjkovic, Sasa Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1431 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions. (August 2015) Authors: Dianoux, Raphaelle; Scheidemann, Adi; Niehuis, Ewald; Mollers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Hug, Hans-Josef; Bernard, Laetitia; Vranjkovic, Sasa Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1431 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Ultra high spatial resolution SIMS with cluster ions — approaching the physical limits. (6th July 2012) Authors: Kollmer, Felix; Paul, Wolfgang; Krehl, Martin; Niehuis, Ewald Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 312 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗