Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces. (August 2020)

Record Type:: Journal Article
Title:: Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces. (August 2020)
Main Title:: Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces
Authors:: Kollmer, Felix
Pirkl, Alexander
Kayser, Sven
Arlinghaus, Henrik
Moellers, Rudolf
Havercroft, Nathan
Niehuis, Ewald
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 26:(2020)Supplement 2
Journal:: Microscopy and microanalysis
Issue:: Volume 26:(2020)Supplement 2
Issue Display:: Volume 26, Issue 2 (2020)
Year:: 2020
Volume:: 26
Issue:: 2
Issue Sort Value:: 2020-0026-0002-0000
Page Start:: 76
Page End:: 77
Publication Date:: 2020-08
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S143192762001329X ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 15128.xml