1. Impact of pattern dependency of SiGe layers grown selectively in source/drain on the performance of 14 nm node FinFETs. (October 2016) Authors: Qin, Changliang; Wang, Guilei; Kolahdouz, M.; Luo, Jun; Yin, Huaxing; Yang, Ping; Li, Junfeng; Zhu, Huilong; Chao, Zhao; Ye, Tianchun; Radamson, Henry H. Journal: Solid-state electronics Issue: Volume 124(2016) Page Start: 10 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Impact of pattern dependency of SiGe layers grown selectively in source/drain on the performance of 14 nm node FinFETs. (October 2016) Authors: Qin, Changliang; Wang, Guilei; Kolahdouz, M.; Luo, Jun; Yin, Huaxing; Yang, Ping; Li, Junfeng; Zhu, Huilong; Chao, Zhao; Ye, Tianchun; Radamson, Henry H. Journal: Solid-state electronics Issue: Volume 124(2016) Page Start: 10 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Impact of pattern dependency of SiGe layers grown selectively in source/drain on the performance of 22 nm node pMOSFETs. (December 2015) Authors: Wang, Guilei; Moeen, M.; Abedin, A.; Xu, Yefeng; Luo, Jun; Guo, Yiluan; Qin, Changliang; Tang, Zhaoyun; Yin, Haizhou; Li, Junfeng; Yan, Jiang; Zhu, Huilong; Zhao, Chao; Chen, Dapeng; Ye, Tianchun; Kolahdouz, M.; Radamson, Henry H. Journal: Solid-state electronics Issue: Volume 114(2015) Page Start: 43 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Impact of pattern dependency of SiGe layers grown selectively in source/drain on the performance of 22 nm node pMOSFETs. (December 2015) Authors: Wang, Guilei; Moeen, M.; Abedin, A.; Xu, Yefeng; Luo, Jun; Guo, Yiluan; Qin, Changliang; Tang, Zhaoyun; Yin, Haizhou; Li, Junfeng; Yan, Jiang; Zhu, Huilong; Zhao, Chao; Chen, Dapeng; Ye, Tianchun; Kolahdouz, M.; Radamson, Henry H. Journal: Solid-state electronics Issue: Volume 114(2015) Page Start: 43 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Sensitivity of Signal-to-Noise Ratio to the Layer Profile and Crystal Quality of SiGe/Si Multilayers. (1st January 2016) Authors: Radamson, H. H.; Moeen, M.; Abedin, A.; Hojabri, A.; Salemi, A.; Kolahdouz, M. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3196 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Sensitivity of Signal-to-Noise Ratio to the Layer Profile and Crystal Quality of SiGe/Si Multilayers. (24th February 2016) Authors: Radamson, H. H.; Moeen, M.; Abedin, A.; Hojabri, A.; Salemi, A.; Kolahdouz, M. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3196 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Significant performance improvement of a terahertz photoconductive antenna using a hybrid structure. Issue 83 (16th November 2017) Authors: Bashirpour, M.; Ghorbani, S.; Kolahdouz, M.; Neshat, M.; Masnadi-Shirazi, M.; Aghababa, H. Journal: RSC advances Issue: Volume 7:Issue 83(2017) Page Start: 53010 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗