Author/Creator: Koelling, Sebastian - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Koelling, Sebastian

1. True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy. (24th March 2017)

Authors:: Vurpillot, Francois; Danoix, Frédéric; Gilbert, Matthieu; Koelling, Sebastian; Dagan, Michal; Seidman, David N.
Editors:: Thuvander, Mattias; Cairney, Julie; Gerstl, Stephan
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 2(2017)
Page Start:: 210
Record Type:: Journal Article
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2. Bottom‐Up Grown 2D InSb Nanostructures. Issue 14 (19th February 2019)

Authors:: Gazibegovic, Sasa; Badawy, Ghada; Buckers, Thijs L. J.; Leubner, Philipp; Shen, Jie; de Vries, Folkert K.; Koelling, Sebastian; Kouwenhoven, Leo P.; Verheijen, Marcel A.; Bakkers, Erik P. A. M.
Journal:: Advanced materials
Issue:: Volume 31:Issue 14(2019)
Page Start:: n/a
Record Type:: Journal Article
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3. Industrial application of atom probe tomography to semiconductor devices. (15th April 2018)

Authors:: Giddings, Alexander Devin; Koelling, Sebastian; Shimizu, Yasuo; Estivill, Robert; Inoue, Koji; Vandervorst, Wilfried; Yeoh, Wai Kong
Journal:: Scripta materialia
Issue:: Number 148(2018)
Page Start:: 82
Record Type:: Journal Article
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4. Electronic Structure and Epitaxy of CdTe Shells on InSb Nanowires. Issue 12 (18th February 2022)

Authors:: Badawy, Ghada; Zhang, Bomin; Rauch, Tomáš; Momand, Jamo; Koelling, Sebastian; Jung, Jason; Gazibegovic, Sasa; Moutanabbir, Oussama; Kooi, Bart J.; Botti, Silvana; Verheijen, Marcel A.; Frolov, Sergey M.; Bakkers, Erik P. A. M.
Journal:: Advanced science
Issue:: Volume 9:Issue 12(2022)
Page Start:: n/a
Record Type:: Journal Article
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5. Critical strain for Sn incorporation into spontaneously graded Ge/GeSn core/shell nanowires. Issue 15 (10th April 2018)

Authors:: Albani, Marco; Assali, Simone; Verheijen, Marcel A.; Koelling, Sebastian; Bergamaschini, Roberto; Pezzoli, Fabio; Bakkers, Erik P. A. M.; Miglio, Leo
Journal:: Nanoscale
Issue:: Volume 10:Issue 15(2018)
Page Start:: 7250
Record Type:: Journal Article
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6. (Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale. (8th September 2020)

Authors:: Koelling, Sebastian; Assali, Simone; Atalla, Mahmoud; Kumar, Aashish; Attiaoui, Anis; Lodari, Mario; Sammak, Amir; Scappucci, Giordano; Moutanabbir, Oussama
Journal:: ECS transactions
Issue:: Volume 98:Number 5(2020)
Page Start:: 447
Record Type:: Journal Article
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7. Three‐Dimensional Atomic‐Scale Tomography of Buried Semiconductor Heterointerfaces. Issue 3 (1st December 2022)

Authors:: Koelling, Sebastian; Stehouwer, Lucas E. A.; Paquelet Wuetz, Brian; Scappucci, Giordano; Moutanabbir, Oussama
Journal:: Advanced materials interfaces
Issue:: Volume 10:Issue 3(2023)
Page Start:: n/a
Record Type:: Journal Article
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8. Impurity and Defect Monitoring in Hexagonal Si and SiGe Nanocrystals. (18th August 2016)

Authors:: Koelling, Sebastian; Plantenga, Rianne C.; Hauge, Hakon I.T.; Ren, Yizhen; Li, Ang; Verheijen, Marcel A.; Conesa Boj, Sonia; Assali, Simone; Koenraad, Paul M.; Bakkers, Erik P.A.M.
Journal:: ECS transactions
Issue:: Volume 75:Number 8(2016)
Page Start:: 751
Record Type:: Journal Article
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9. Evolution of the precipitate composition during annealing of vanadium micro-alloyed steels by in-situ SANS. (December 2020)

Authors:: Ioannidou, Chrysoula; Navarro-López, Alfonso; Rijkenberg, Arjan; Dalgliesh, Robert M.; Koelling, Sebastian; Pappas, Catherine; Sietsma, Jilt; van Well, Ad A.; Erik Offerman, S.
Journal:: Acta materialia
Issue:: Volume 201(2020)
Page Start:: 217
Record Type:: Journal Article
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