1. Dose Rate Considerations for Semiconductor Electronics: Why Current Variations Enable Unique GaN-based Transmission Electron Microscopy. (August 2020) Authors: Specht, Petra; Kirste, Ronny; Sitar, Zlatko; Anderson, Travis; Koehler, Andrew; Kisielowski, Christian Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 3064 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗