1. Advances in Large-Scale Metrology – Review and future trends. Issue 2 (2016) Authors: Schmitt, R.H.; Peterek, M.; Morse, E.; Knapp, W.; Galetto, M.; Härtig, F.; Goch, G.; Hughes, B.; Forbes, A.; Estler, W.T. Journal: CIRP annals Issue: Volume 65:Issue 2(2016) Page Start: 643 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Measurement technologies for precision positioning. Issue 2 (2015) Authors: Gao, W.; Kim, S.W.; Bosse, H.; Haitjema, H.; Chen, Y.L.; Lu, X.D.; Knapp, W.; Weckenmann, A.; Estler, W.T.; Kunzmann, H. Journal: CIRP annals Issue: Volume 64:Issue 2(2015) Page Start: 773 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗