Advances in Large-Scale Metrology – Review and future trends. Issue 2 (2016)

• Record Type: Journal Article
• Authors: Schmitt, R.H.; Peterek, M.; Morse, E.; Knapp, W.; Galetto, M.; Härtig, F.; Goch, G.; Hughes, B.; Forbes, A.; Estler, W.T.
• Is Part Of: CIRP annals. Volume 65:Issue 2(2016)
• Page Start: 643
• Page End: 665
• Publication Date: 2016
• Subjects: Metrology -- Modeling -- Large-Scale Metrology; Production engineering -- Research -- Periodicals; 670.5
• DOI: 10.1016/j.cirp.2016.05.002
• Languages: English
• ISSNs: 0007-8506

Abstract

Abstract: The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.