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4. Analyses of the plastic deformation of coated conductors deconstructed from ultra-high field test coils. (12th August 2020)

8. Comparative Study on the Gate‐Induced Electrical Instability of p‐Type SnO Thin‐Film Transistors with SiO2 and Al2O3/SiO2 Gate Dielectrics. Issue 10 (2nd August 2020)