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Author/Creator Kempe, Michael D.

1. Advancing reliability assessments of photovoltaic modules and materials using combined‐accelerated stress testing. (18th September 2020)

Authors:
Owen‐Bellini, Michael; Hacke, Peter; Miller, David C.; Kempe, Michael D.; Spataru, Sergiu; Tanahashi, Tadanori; Mitterhofer, Stefan; Jankovec, Marko; Topič, Marko
Journal:
Progress in photovoltaics
Issue:
Volume 29:Number 1(2021)
Page Start:
64
Record Type:
Journal Article
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2. Degradation in photovoltaic encapsulant transmittance: Results of the first PVQAT TG5 artificial weathering study. (21st January 2019)

Authors:
Miller, David C.; Bokria, Jayesh G.; Burns, David M.; Fowler, Sean; Gu, Xiaohong; Hacke, Peter L.; Honeker, Christian C.; Kempe, Michael D.; Köhl, Michael; Phillips, Nancy H.; Scott, Kurt P.; Singh, Ashish; Suga, Shigeo; Watanabe, Shin; Zielnik, Allen F.
Journal:
Progress in photovoltaics
Issue:
Volume 27:Number 5(2019)
Page Start:
391
Record Type:
Journal Article
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8. Field testing of thermoplastic encapsulants in high‐temperature installations. Issue 6 (November 2015)

Authors:
Kempe, Michael D.; Miller, David C.; Wohlgemuth, John H.; Kurtz, Sarah R.; Moseley, John M.; Shah, Qurat A.; Tamizhmani, Govindasamy; Sakurai, Keiichiro; Inoue, Masanao; Doi, Takuya; Masuda, Atsushi; Samuels, Sam L.; Vanderpan, Crystal E.
Journal:
Energy science & engineering
Issue:
Volume 3:Issue 6(2015)
Page Start:
565
Record Type:
Journal Article
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9. Long‐Term Degradation of Passivated Emitter and Rear Contact Silicon Solar Cell under Light and Heat. Issue 1 (23rd November 2021)

Authors:
Xiao, Chuanxiao; Johnston, Steve; Jiang, Chun-Sheng; LaSalvia, Vincenzo; Sulas-Kern, Dana B.; Kempe, Michael D.; Young, David L.; Jordan, Dirk C.; Al-Jassim, Mowafak M.; Repins, Ingrid
Journal:
Solar RRL
Issue:
Volume 6:Issue 1(2022)
Page Start:
n/a
Record Type:
Journal Article
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10. Measurement of crack length in width tapered beam experiments. Issue 4 (16th February 2021)

Authors:
Kempe, Michael D.; Morse, Joshua; Eafanti, Joshua; Julien, Scott E.; Wan, Kai-tak; Bruckman, Laura S.; Wang, Yu; French, Roger H.; Fairbrother, Andrew; Gu, Xiaohong; Napoli, Sophie; O'Brien, Gregory S.; Hauser, Adam W.; Ji, Liang; Boyce, Kenneth P.
Journal:
Journal of adhesion science and technology
Issue:
Volume 35:Issue 4(2021)
Page Start:
357
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗