1. A Workflow for Imaging 2D Materials using 4D STEM-in-SEM. (August 2019) Authors: Caplins, Benjamin W.; White, Ryan M.; Holm, Jason D.; Keller, Robert R. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 218 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Acceptance Angle Control for Improved Transmission Imaging in an SEM. (6th March 2017) Authors: Holm, Jason; Keller, Robert R. Journal: Microscopy today Issue: Volume 25:Number 2(2017) Page Start: 12 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Beam broadening in transmission and conventional EBSD. (April 2017) Authors: Rice, Katherine P.; Chen, Yimeng; Keller, Robert R.; Stoykovich, Mark P. Journal: Micron Issue: Volume 95(2017:Apr.) Page Start: 42 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Beam Broadening in Transmission EBSD. (16th March 2015) Authors: Rice, Katherine P.; Keller, Robert R.; Stoykovich, Mark P. Journal: Microscopy today Issue: Volume 23:Number 2(2015) Page Start: 32 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel Plate†. (6th May 2016) Authors: Woehl, Taylor J.; White, Ryan M.; Keller, Robert R. Journal: Microscopy and microanalysis Issue: Volume 22:Number 3(2016:Jun.) Page Start: 544 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Firearm Serial Number Restoration with Electron Backscatter Diffraction. (23rd September 2015) Authors: White, Ryan M.; Keller, Robert R. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1363 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Firearm Serial Number Restoration with Electron Backscatter Diffraction. (August 2015) Authors: White, Ryan M.; Keller, Robert R. Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1363 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Orientation mapping of graphene in a scanning electron microscope. (August 2019) Authors: Caplins, Benjamin W.; Holm, Jason D.; Keller, Robert R. Journal: Carbon Issue: Volume 149(2019) Page Start: 400 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Restoration of firearm serial numbers with electron backscatter diffraction (EBSD). (April 2015) Authors: White, Ryan M.; Keller, Robert R. Journal: Forensic science international Issue: Volume 249(2015) Page Start: 266 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Thickness-Dependent Beam Broadening in Transmission EBSD. (August 2014) Authors: Rice, Katherine P.; Keller, Robert R. Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 854 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗