1. Can the ISO 14595 Method be Used to Validate the Heterogeneity and Composition of Natural Mineral Standards Using WDS And/or EDS?. (August 2020) Authors: Burgess, Simon; Pinard, Philippe; Kearns, Stuart; Buse, Ben; Dyson, Heather; Jones, Rosie Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1778 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold Finger. (5th October 2016) Authors: Buse, Ben; Kearns, Stuart; Clapham, Charles; Hawley, Donovan Journal: Microscopy and microanalysis Issue: Volume 22:Number 5(2016:Oct.) Page Start: 981 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Probe Microanalysis of U and U-alloys… How Hard Can It Be?. (August 2019) Authors: Matthews, Mike; Kearns, Stuart; Buse, Ben Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1552 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Evaluating X-Ray Microanalysis Phase Maps Using Principal Component Analysis. (21st March 2018) Authors: Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 24:Number 2(2018) Page Start: 116 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. FEG-EPMA of Solid State Redox Sensors - the Effect of Secondary Fluorescence on Analytical Precision. (August 2014) Authors: Wade, Jon; Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 728 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. FEG-EPMA of Solid State Redox Sensors - the Effect of Secondary Fluorescence on Analytical Precision. (August 2014) Authors: Wade, Jon; Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 728 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals. (16th April 2015) Authors: Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 21:Number 3(2015:Jun.) Page Start: 594 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals. (August 2014) Authors: Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 704 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals. (August 2014) Authors: Buse, Ben; Kearns, Stuart Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 704 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials. (August 2014) Authors: Kearns, Stuart; Buse, Ben; Wade, Jon Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 740 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗