1. Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Issue 20 (January 2020) Authors: Niozu, A; Kumagai, Y; Nishiyama, T; Fukuzawa, H; Motomura, K; Bucher, M; Ito, Y; Takanashi, T; Asa, K; Sato, Y; You, D; Li, Y; Ono, T; Kukk, E; Miron, C; Neagu, L; Callegari, C; Fraia, M Di; Rossi, G; Galli, D E Journal: Journal of physics Issue: Volume 1412:Issue 20(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗