Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Issue 20 (January 2020)

• Record Type: Journal Article
• Authors: Niozu, A; Kumagai, Y; Nishiyama, T; Fukuzawa, H; Motomura, K; Bucher, M; Ito, Y; Takanashi, T; Asa, K; Sato, Y; You, D; Li, Y; Ono, T; Kukk, E; Miron, C; Neagu, L; Callegari, C; Fraia, M Di; Rossi, G; Galli, D E; Pincelli, T; Colombo, A; Kameshima, T; Joti, Y; Hatsui, T; Owada, S; Katayama, T; Togashi, T; Tono, K; Yabashi, M; Matsuda, K; Bostedt, C; Nagaya, K; Ueda, K;
• Is Part Of: Journal of physics. Volume 1412:Issue 20(2019)
• Publication Date: 2020-01
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1412/20/202028
• Languages: English
• ISSNs: 1742-6588

Abstract

Synopsis: We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.