1. Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector. (6th March 2017) Authors: Terborg, Ralf; Kaeppel, Andi; Yu, Baojun; Patzschke, Max; Salge, Tobias; Falke, Meiken Journal: Microscopy today Issue: Volume 25:Number 2(2017) Page Start: 30 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗