Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector. (6th March 2017)

Record Type:: Journal Article
Title:: Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector. (6th March 2017)
Main Title:: Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector
Authors:: Terborg, Ralf
Kaeppel, Andi
Yu, Baojun
Patzschke, Max
Salge, Tobias
Falke, Meiken
Abstract:
Is Part Of:: Microscopy today. Volume 25:Number 2(2017)
Journal:: Microscopy today
Issue:: Volume 25:Number 2(2017)
Issue Display:: Volume 25, Issue 2 (2017)
Year:: 2017
Volume:: 25
Issue:: 2
Issue Sort Value:: 2017-0025-0002-0000
Page Start:: 30
Page End:: 35
Publication Date:: 2017-03-06
Subjects:: Microscope and microscopy -- Periodicals
502.8
Journal URLs:: http://www.microscopy-today.com/ ↗
https://academic.oup.com/mt ↗
http://journals.cambridge.org/action/displayJournal?jid=MTO ↗
http://www.microscopy-today.com/jsp/mto/common/home.faces ↗
DOI:: 10.1017/S1551929517000141 ↗
Languages:: English
ISSNs:: 1551-9295
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 1116.xml