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3. Bevel Structure Based XPS Analysis as a Non‐Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors. Issue 5 (10th April 2021)

4. Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering. Issue 4 (5th January 2018)

5. Degradation of High‐Nickel‐Layered Oxide Cathodes from Surface to Bulk: A Comprehensive Structural, Chemical, and Electrical Analysis. Issue 36 (9th August 2020)

6. Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering. Issue 1 (11th December 2017)